The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Jun. 22, 2001
David A. Martin, Atlantic Highlands, NJ (US);
Mark C. Spaeth, Cambridge, MA (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
The present invention relates to a high speed sample and hold circuit which comprises a plurality of sample and hold subcircuits coupled in parallel between an input and an output. The circuit also comprises a calibration circuit coupled to the plurality of sample and hold subcircuits. The calibration circuit is operable to modify a hold signal for one or more of the plurality of sample and hold subcircuits to thereby reduce timing mismatch between the plurality of sample and hold subcircuits and distortion associated therewith. The present invention also comprises a method of reducing timing mismatch in a high speed, parallel coupled sample and hold circuit. The method comprises detecting timing mismatch associated with a plurality of sample and hold subcircuits and modifying a hold signal for one or more of the subcircuits. In one exemplary method, the timing mismatch is detected by converting the sample and hold circuit output data to digital data and performing a fast Fourier transform thereon, and analyzing the resulting energy spectrum.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile