The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6482604 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 19, 2002

Filed:

Mar. 12, 2001
Applicant:
Inventor:

Sung Yun Kwon, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/54 ; C12Q 1/00 ; C12Q 1/26 ;
U.S. Cl.
CPC ...
C12Q 1/54 ; C12Q 1/00 ; C12Q 1/26 ;
Abstract

Methods for sampling an analyte present in a biological system are provided. The methods entail use of particle delivery methods to obtain a sample of an analyte of interest from the system.


Find Patent Forward Citations

Kwon, Sung. (2002). Non-or minimally invasive monitoring methods using particle delivery methods (U.S. Patent No. 6482604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6482604

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…