The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2002
Filed:
Aug. 23, 2000
Applicant:
Inventors:
Kwan Chan, Fort Worth, TX (US);
John W. Sheets, Jr., Fort Worth, TX (US);
Mutlu Karakelle, Fort Worth, TX (US);
Assignee:
Alcon Manufacturing, Ltd., Fort Worth, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61F 2/16 ;
U.S. Cl.
CPC ...
A61F 2/16 ;
Abstract
A method for determining the propensity of an intraocular lens material to prevent posterior capsule opacification is disclosed. The method involves contacting a sample of an IOL material having the shape of an IOL optic with collagen to form a contact area, incubating the sample in a liquid composition comprising lens epithelial cells, determining whether lens epithelial cells grow on the collagen in the contact area.
Chan, Kwan. (2002). Lens epithelial cell growth assay for intraocular lens materials (U.S. Patent No. 6482230). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6482230
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile