The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2002

Filed:

Feb. 29, 2000
Applicant:
Inventors:

Franz Wiesauer, Zipf, AT;

Arthur Gritzky, Pollham, AT;

Min Hwa Lee, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

For that method to examine an object by using ultrasound waves a spatial region of the object is scanned by a 3D probe. From the reflected echo signals just signals are processed which fulfil certain selectable criteria and taken to display it according to their position on at least one display device. For the representation of one or more objects with one or more interesting layers the geometrical selection criterion is a shell which approximates a surface of the object or of a layer and which can have a certain thickness, and only signals which are selected by this shell will be processed and displayed. This results in a undisturbed representation of the object and allows better view to the characteristic of the surface regarding structure or perfusion.


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