The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

Dec. 14, 2000
Applicant:
Inventors:

Subbu Ganesan, Saratoga, CA (US);

Leonid Alexander Broukhis, Fremont, CA (US);

Ramesh Narayanaswamy, Mountain View, CA (US);

Ian Michael Nixon, Sunnyvale, CA (US);

Assignee:

Tharas Systems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A functional verification system which can be used to evaluate either cycle based designs or non-cycle based designs. A target design is partitioned into multiple clusters, with a combinatorial block in each cluster being assigned to an evaluation unit. A flow control memory stores data indicating the sequence in which the clusters are to be evaluated. The evaluation units evaluate combinatorial blocks within a cluster in parallel. A cluster control memory indicates the manner in which a register is to be modified upon the evaluation (and results) of each cluster. The instructions in the flow control memory may be designed to examine the contents of the register and evaluate the clusters in different sequences depending on the content of the register. Evaluation of a loop of a non-cycle based design can thus be terminated based on the contents of the register.


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