The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2002
Filed:
Apr. 03, 2000
Applicant:
Inventors:
Jeffery Alan Fisk, Olney, MD (US);
Richard Eric Nordgren, Daleville, VA (US);
Assignee:
MeadeWestvaco Corporation, Stamford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/06 ;
U.S. Cl.
CPC ...
G02B 6/06 ;
Abstract
This invention concerns a technique and an apparatus that is used for the measurement of bi-axial strain in printed paperboard or paperboard based laminates. Such strain information is useful for determining the margin to failure of various features of laminated paperboard cartons, such as those used in the liquid packaging industry. Knowing such margins of failure is crucial for ensuring integrity of the microbiological barrier in aseptic liquid packaging.