The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

May. 24, 1999
Applicant:
Inventor:

Hung-Chan Chien, Taipei, TW;

Assignee:

Benq Corporation, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/46 ;
U.S. Cl.
CPC ...
H04N 1/46 ;
Abstract

A method of obtaining the gray level of a scanned object, comprising the steps of: providing at least three corrective elements, wherein each of the corrective elements has different light reflectivity, and the gray levels of the corrective elements are pre-defined and pre-stored; scanning those corrective elements to obtain the light reflectivities of each of the corrective elements; scanning the object to obtain its light reflectivity; comparing the light reflectivity of the object with the light reflectivity of each of the corrective elements to determine two corrective elements whose light reflectivities are closer to the light reflectivity of the object; and using the light reflectivities of the two determined corrective elements and their corresponding gray levels in conjunction with the interpolation method to determine the corresponding gray levels of the object.


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