The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

Oct. 13, 1999
Applicant:
Inventors:

Yoshiaki Shimomura, Nagasaki, JP;

Naoki Miyanagi, Ibaraki, JP;

Takashi Moro, Ibaraki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/114 ;
U.S. Cl.
CPC ...
G01B 1/114 ;
Abstract

An optical deflection angle measuring apparatus which, upon optically measuring a deflection angle, does not require an operation for directing a light onto a position detecting element and makes it possible to obtain measurement results without being affected by external force such as vibrations. A detector is constructed with a common lens for converging diffuse lights from light sources . Position detecting elements - - receive the thus-converged lights from the light sources and detect received positions of the converged lights. Reflecting prisms - - allow the diffuse lights from the light sources to be transmitted and guided so that the diffuse lights from the light sources , are converged, by the lens , onto the position detecting elements - - . The respective position detecting elements are arranged so as not to interfere with the convergence of the lights by the lens . The deflection angle &PHgr; can then be measured by computation.


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