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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6480286 B1

PDFFull Text
Date of Patent:
Nov. 12, 2002

Filed:

Mar. 22, 2000

Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus

Applicant:
Inventors:

Keishi Kubo, Moriguchi, JP;

Keiichi Yoshizumi, Higashiosaka, JP;

Yukio Imada, Hirakata, JP;

Hiroyuki Takeuchi, Hirakata, JP;

Koji Handa, Osaka, JP;

Assignee:

Matsushita Electric Inudstrial Co., Ltd., Osaka, JP;

Attorney:

Jordan and Hamburg LLP

Primary Examiner:

Samuel A Turner

Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

Optical displacement gauges are respectively arranged on both sides of a thin sheet material w, and displacement of surface position of the thin sheet material w is measured by irradiating measurement light L to the surface of the thin sheet material w. Thickness variation of the thin sheet material w is obtained from the measurement results of displacement of the surface position of the thin sheet material w.

Find Patent Forward Citations

Kubo, Keishi. (2002). Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus (U.S. Patent No. 6480286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6480286

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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