The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

May. 08, 2000
Applicant:
Inventors:

Timothy M. Chinowsky, Seattle, WA (US);

Sinclair S. Yee, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/105 ;
U.S. Cl.
CPC ...
G01N 2/105 ;
Abstract

SPR sensors and multisensors having capillary geometry. Sensors have a capillary substrate in which at least a portion of the inside surface of the capillary is provided with an SPR-sensing area. Samples for analysis are introduced into the capillary cavity. SPR is measured by radially illuminated the capillary SPR-sensing area with light having a TM-polarized component. Light reflected from the SPR-sensing area exiting radially from the capillary is detected at selected angles to obtain reflectivity as a function of incidence angle to determine RI of the sample in the vicinity of the SPR-sensing area. The capillary geometry is readily adaptable to simultaneous measurement of several optical properties of a given sample in addition to SPR by radial and/or axial illumination of the sample. Multisensors with capillary geometry which simultaneously measure SPR and bulk RI are provided. Multisensors which combine SPR measurements with fluorescence or chemiluminescence, Raman scattering, or absorption measurements are also provided.


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