The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2002
Filed:
Feb. 11, 2000
Stephen R. Wilk, Saugus, MA (US);
Optikos Corporation, Cambridge, MA (US);
Abstract
A process for measuring at least one parameter of an optical element having first and second surfaces on opposed sides thereof uses a reflection-reducing member, which is solid and has substantial mechanical integrity, but which is resilient and elastically deformable so as to conform to a surface with which it is placed in contact. This reflection-reducing member is contacted with the second surface of the optical element so that a surface of the reflection-reducing member conforms to this second surface, the parameter is measured, and the reflection-reducing member is removed from the second surface leaving this surface substantially free from any residue. The presence of the reflection-reducing member reduces or eliminates unwanted reflections from the second or “back” surface of the optical element, thus simplifying the measurement of any parameter which depends upon detecting reflection from the first or “front” surface of the optical element.