The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

Nov. 13, 2000
Applicant:
Inventors:

Mikhail Gelfand, Milford, CT (US);

Richard Opalanko, Trumbull, CT (US);

Kenneth Engquist, Hamden, CT (US);

William F. Schwartz, Bailey, CO (US);

Alexander Probst, Bailey, CO (US);

Assignee:

GL&V/ Dorr-Oliver Inc., Milford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/702 ;
U.S. Cl.
CPC ...
G01R 2/702 ;
Abstract

In a solids profile measurement system for determining the quality of a solids bed formed from a liquid-solid slurry in a vessel, a sensor adapted to generate signals indicative of a profile as measured by progressively immersing the sensor deeper into the slurry is provided. An extension mechanism, at least a portion of which is coupled at one end to the sensor and at an opposite end to a piece of processing equipment, is provided to affect retrograde movement in a first direction to immerse the sensor in a slurry, and in a second direction opposite the first direction. A controller in communication with the extension mechanism is also provided and issues commands thereto and receives signals generated by the sensor.


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