The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2002
Filed:
Jun. 18, 2001
Micro-Epsilon Messtechnik GmbH & Co. KG, Ortenburg, DE;
Abstract
A method for operating an eddy current sensor ( ) with a measuring coil ( ) and an evaluation circuit ( ) for determining material or geometric parameters of a test object ( ), in which the test object ( ) is arranged at a distance (d) from the measuring coil ( ). The impedance of the measuring coil ( ) is evaluated, while the measuring coil ( ) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit ( ) determines the material and geometric parameters of the test object ( ) based on the impedance of the measuring coil ( ). The impedance of the measuring coil ( ) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil ( ) is determined at an alternating voltage of a second frequency, and the evaluation circuit ( ) computes the material and geometric parameters of the test object ( ) on the basis of the impedances of the measuring coil ( ) at the first and the second frequencies. An eddy current sensor ( ) is also disclosed, which can be used with advantage in conjunction with the method.