The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

May. 30, 2001
Applicant:
Inventors:

Nozomu Hachisuka, Tokyo, JP;

Katsuhiko Tomita, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/312 ; G11B 5/455 ;
U.S. Cl.
CPC ...
G01R 3/312 ; G11B 5/455 ;
Abstract

A method for testing a thin-film magnetic head with a MR read head element includes a step of applying a low-frequency or DC external magnetic field to the thin-film magnetic head from a stationary magnetic field generation unit, a step of executing a high-frequency amplification of an output from the MR read head element under the application of the external magnetic field to provide a high-frequency amplified signal, a step of deriving only a high-frequency component from the high-frequency amplified signal to provide a high-frequency component signal, and a step of judging whether the thin-film magnetic head occurs a noise or not by using the high-frequency component signal.


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