The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2002
Filed:
Mar. 16, 2000
Jack Chang, Hsinchu, TW;
Gina Liang, Hsinchu, TW;
Wu-Shun Wang, Hsinchu, TW;
James W. Liang, Hsinchu, TW;
Hung-Chang W. Huang, Taoyuan, TW;
Trace Storage Technology Corp., Hsingchu, TW;
Abstract
A magnetic recording medium using a nonmagnetic interlayer in between a Cr-base underlayer and a Co magnetic layer is disclosed. The nonmagnetic interlayer comprises Co Cr X Y Z . X is a material selected from Ni or Fe so as to substitute a portion of Cr composition. Y is a material selected from materials which can form a solid solution with at least one of list materials consisting of Ni, Fe, Co, and Cr. The Y materials added in the interlayer is to adjust the lattice mismatch of interface between the interlayer and the underlayer to a magnitude so that the interlayer formed on the underlayer at least is a texture layer, an epitaxial layer is best preferred. However, Z is a material which is insoluble with any of above list materials, Cr, Co, X, and Y in a solid state so as to form precipitates, thereby inhibiting the grain growth. In a preferred embodiment, the &agr;, &bgr;, &ggr;, and &zgr; are about 25-41%, 0.1-5%, 0.1-5%, and 0.1-5%, respectively. The interlayer thickness is of between about 0.5-20 nm.