The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

Dec. 06, 1999
Applicant:
Inventors:

Ho Wai Wong-Lam, Los Altos, CA (US);

Mark Douglas Naley, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

The present invention is directed to systems and methods for analyzing and characterizing a time-limited waveform to avoid significant delays and miscalculations due to the presence of spurious transitions. In an example implementation, a processor is adapted to sense the signal and interpret various parameters of the waveform using a correlation method. In one application, the correlation method includes providing an autocorrelation function of a segment of the waveform that includes at least one period, and approximating a period of the waveform using peaks in the autocorrelation function. Other aspects of the invention involve approximating the period of the waveform by identifying a segment of the waveform having a steep slope magnitude that exceeds a certain threshold, and determining a polarity associated with the waveform.


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