The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

Aug. 08, 2000
Applicant:
Inventors:

Masaru Eguchi, Tokyo, JP;

Koichi Furusawa, Tokyo, JP;

Shinsuke Okada, Saitama-ken, JP;

Ryo Ozawa, Tokyo, JP;

Tetsuya Nakamura, Saitama-ken, JP;

Tetsuya Utsui, Saitama-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract

An endoscope system is provided with first and second light guides, which are optically coupled by an optical coupler. A low-coherent light source is provided, and the light emitted therefrom is incident on the first or second light guide. Further provided is a scanning unit that causes the light beam emerged from the first light guide to scan on a predetermined surface of the object. The light beam reflected by the object is directed, by the scanning unit, to the first light guide as a detection light beam. A light beam emerged from the second light guide is reflected by a reflector and returned to the second light guide as a reference beam. By varying the optical path length of the reference beam relative to that of the detection beam, two beams interfere. A signal processing system generates OCT image based on the signal detected by a light detecting device which receives the interfering beams.


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