The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
Nov. 17, 1999
Volker Lehmann, München, DE;
Rainer Golenhofen, Ettlingen, DE;
Bruker AXS Analytical X-Ray Systems GmbH, Karlsruhe, DE;
Abstract
An X-ray analysis device ( ) having an X-ray source ( ) for illuminating a sample ( ) with X-radiation ( ), a sample support for receiving the sample ( ) and a detector ( ) for detecting the diffracted or scattered X-radiation or fluorescent X-radiation ( ′) emitted by the sample, wherein an X-ray optical construction element of semi-conductor material having a plurality of channels which are essentially transparent to X-radiation ( ′) is provided in the path of rays between the X-ray source ( ) and the detector ( ), is characterized in that the X-ray optical construction element comprises a semi-conductor wafer ( ) into which micropores ( ) are etched which extend essentially in parallel in the direction of the rays and have diameters of 0.1 to 100 &mgr;m, preferably 0.5 and 20 &mgr;m. Such X-ray optical construction elements are, on the one hand, not poisonous, and on the other hand particularly transparent for X-rays, wherein a relatively high mechanical rigidity can be achieved also with large openings and very short construction lengths and thus also a particularly long service life and high pressure stability and density.