The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
Dec. 06, 1999
Keiji Shimatani, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A magnetic disk apparatus has a measuring pattern writing unit and an optimum offset measuring unit. The measuring pattern writing unit writes random patterns to adjacent tracks on both sides of a measuring track and, thereafter, writes a preamble pattern in which PR4 equalizing characteristics are normally obtained even if simple low pass filter characteristics have initially been set. The optimum offset measuring unit obtains a mean square error per sample obtained by dividing the sum &Sgr;(y−W) of the squares of differences between sampling values y which were PR4 equalized and a predetermined ideal sampling value W in which there is no noise by the number of samples (N) while changing an offset amount, and determines an offset in which the mean square error is the minimum as an optimum offset.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile