The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

Jul. 10, 2001
Applicant:
Inventors:

Haim Kedar, Palo Alto, CA (US);

Edward Perry Wallerstein, Pleasanton, CA (US);

Albert William Brown, Jr., San Jose, CA (US);

Assignee:

Affymax Research Institute, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/322 ; G02B 9/00 ;
U.S. Cl.
CPC ...
G02B 1/322 ; G02B 9/00 ;
Abstract

A multiple element color-corrected doubly telecentric lens and imaging system useful for imaging multiwell plates is described. The lens contains a biconvex field lens element L , a positive meniscus lens element L , concave toward the incident light side, a double-Gauss lens element group, a positive meniscus lens element L , convex toward the incident light, a positive meniscus lens element L , convex toward the incident light, and a plano concave field flattener lens element L , concave toward the incident light side. The lens is very sensitive, and can be used to image scintillation proximity assays in multiwell plates.


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