The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

Dec. 01, 2000
Applicant:
Inventor:

Ray F Lee, Clifton-Park, NY (US);

Assignee:

Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

There is featured a method for parallel spatial encoding MR image data that is frequency-encoded and sensitivity-encoded that includes applying an analytical transform function to generate weighting coefficients for a given spatial harmonic order and detector index; generating linear combinations of the frequency-encoded and sensitivity-encoded MR image data to generate a set of spatial harmonics that can encode spatial frequencies; and applying at least a 1D Fourier transform to a k-space data set in which spatial frequency dimensions are fully encoded, thereby resulting in. an MR image of an observed object. The method includes synchronizing the MR image data signals to remove spatially-dependent phase errors using for example Fourier-Hilbert Transforms. The method yet further includes demodulating the modulation of generated high order harmonics. Also featured are systems, apparatuses and other processing methods.


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