The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
Sep. 27, 2000
Applicant:
Inventors:
Jinhui Zhai, Plano, TX (US);
Tuviah E. Schlesinger, Mt. Lebanon, PA (US);
Daniel D. Stancil, Mars, PA (US);
Assignee:
Carnegie Mellon University, Pittsburgh, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 ;
U.S. Cl.
CPC ...
H01J 3/14 ;
Abstract
A system for measuring a size of a focused spot of an optical energy beam. The system includes a grating, a beam scanner oriented between a source of the optical energy beam and the grating, and a detector oriented to sense a diffraction pattern of the grating.
Zhai, Jinhui. (2002). System and method for measuring the size of a focused optical spot (U.S. Patent No. 6476382). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6476382
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile