The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

Oct. 13, 2000
Applicant:
Inventors:

Robert J. O'Donnell, Fremont, CA (US);

Gregory J. Goldspring, Alameda, CA (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 8/00 ;
U.S. Cl.
CPC ...
C23C 8/00 ;
Abstract

A method of improving the post-etch corrosion resistance of aluminum-containing wafers by performing a two-step post-etch passivation sequence which does not involve a plasma. In the first step the pressure is high, relative to typical passivation procedures, and the wafer temperature is relatively low. In the second step, the pressure is ramped down and the wafer temperature is ramped up. This two-step approach results in a more-efficient removal of chlorine from the wafer, and hence improved corrosion resistance.


Find Patent Forward Citations

O'Donnell, Robert. (2002). Post-metal etch treatment to prevent corrosion (U.S. Patent No. 6475298). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6475298

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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