The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

May. 11, 2000
Applicant:
Inventors:

Gerd Ulbers, Riggisberg, CH;

Hansruedi Widmer, Niederscheri, CH;

Eberhard Pertz, Epalinges, CH;

Reto Studer, Avenches, CH;

David Lobel, Tel-Aviv, IL;

Hans Fankhauser, Rapperswil, CH;

Assignee:

Haag-Streit AG, Koniz, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract

The present invention relates to a system for the stereoscopic examination of a patient's eye using a slit-lamp microscope ( ), wherein the patient's eye ( ) is illuminated by a light strip of a predetermined cross section which is emitted by a light source ( ). The light source ( ) is arranged on the vertical arm ( ) of a support ( ) and the eye ( ) to be examined is placed in an essentially horizontal plane on one side of said support. The stereo-microscope ( ) is essentially placed on a plane which is located on the side opposite to the first side of the support ( ). The vertical arm ( ) of the support ( ) is made in the shape of a column having a narrow cross section so as to minimize the optical obstruction between the stereo-microscope ( ) and the patient's eye. Using at least one beam ( ) from the stereo-microscope ( ), a partial ray is stopped down and the image information of said ray is directed to a reception unit ( ) located in said stereo-microscope ( ).


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