The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
Mar. 19, 2001
Chi-Neng Arthur Han, Philadelphia, PA (US);
Robert K. Yang, Flushing, NY (US);
Alex J. Phinn, Bristol, PA (US);
Other;
Abstract
A system including methods and apparatus for measuring properties of a material, such as surface tension, surface energy, absorption, adsorption, permeability, porosity and printability and the like. A chemical marker containing test liquid is applied to the material and excess test liquid not retained by the material is removed. Thereafter, either the removed test liquid or the test liquid retained by the material is analyzed to determine the amount of chemical marker substance in the test liquid and, thus, the desired property of the material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile