The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2002
Filed:
Jan. 04, 2000
Hiroyuki Seki, Kawasaki, JP;
Yoshinori Tanaka, Kawasaki, JP;
Shuji Kobayakawa, Kawasaki, JP;
Takeshi Toda, Kawasaki, JP;
Masafumi Tsutsui, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The invention provides a technique for measurement of a signal to interference power ratio wherein an SIR can be measured with a higher degree of accuracy without being influenced by a fast fading environment or an inter-station interference or noise environment. A signal to interference power ratio measuring apparatus includes a plurality of interference replica signal production sections for performing de-spread processing for input signals originating from a received signal, performing temporary decision of information symbols regarding the input signals, performing spread processing again for the input signals and outputting resulting signals as interference replica signals, a plurality of subtractors for subtracting the interference replica signals from the received signal, an interference power detection section for detecting interference power information, a signal power detection section for detecting signal power information, and a signal to interference power ratio calculation section for calculating signal to interference power ratios from the interference power information and the signal power information.