The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2002

Filed:

Sep. 15, 2000
Applicant:
Inventor:

Kunio Toshimitsu, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract

A specimen of transparent living material is covered over with a cover glass while being observed. An optical image of this specimen captured by an objective lens includes spherical aberration due to the cover glass. The spherical aberration included in the optical image is corrected by a correction optical system. Imaging is performed while varying this spherical aberration correction amount. From the plurality of images which have been imaged, an image is selected whose spherical aberration is the least, according to increase and decrease of contrast. Imaging is performed while driving the correction optical system so as to bring the spherical aberration correction amount to be equal to that when the selected image was imaged.


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