The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2002

Filed:

May. 03, 2000
Applicant:
Inventors:

James M. Dawley, Dousman, WI (US);

Andrew T. Jakubowski, Milwaukee, WI (US);

Michael F. Meckl, Kewaskum, WI (US);

Assignee:

Air Logic Power Systems, Inc., Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; G01N 9/04 ;
U.S. Cl.
CPC ...
G01N 2/100 ; G01N 9/04 ;
Abstract

An integrated leak and vision inspection system is provided that accurately and efficiently inspects a bottle or other container for manufacturing defects. The system provides a series of visual inspection stations with cameras and lighting that are integrated onto a rotary inspection system for on-line inspection of containers. A microprocessor in data communication with each of the inspection stations receives and analyzes image data of the particular area or parameter of the container being inspected or tested, and generates data relating to the container based upon predetermined criteria. The stations are arranged to provide an integrated and fully automated and efficient inspection system. In the preferred embodiment, the system is structured with a first station integrated with an entry starwheel to inspect the top seal surface of the container. As the container moves out of the starwheel, a probe from a leak test assembly seals the container opening and the container is tested for leaks as it moves on a main turntable into and through a second station to visually inspect the neck finish. The container is then transported on the turntable to a third station integrated with an exit starwheel to visually inspect the base of the container. The exit starwheel shifts the container onto the line conveyor to a reject station, which removes any containers that are below the set standards.


Find Patent Forward Citations

Dawley, James. (2002). Integrated leak and vision inspection system (U.S. Patent No. 6473169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6473169

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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