The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2002

Filed:

Feb. 06, 2001
Applicant:
Inventors:

Clifford Mark Kelly, Windham, NH (US);

Marc Auerbach, Cupertino, CA (US);

Jonathan Fitch, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 7/04 ;
U.S. Cl.
CPC ...
H03M 7/04 ;
Abstract

A sampling system includes an input terminal for receiving a data signal having a signal component and possibly a noise component. A sampler samples the data signal at a sample rate set in responsive to a control signal. A noise detector detects the presence of a noise component, and if a noise component is detected, generates the control signal conditioning the sampler to sample the data signal at a first sample rate satisfying the Nyquist criterion for the data signal including the noise component, and otherwise generating the control signal conditioning the sampler to sample the data signal at a second data rate satisfying the Nyquist criterion for the data signal including only the signal component.


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