The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2002
Filed:
Jun. 15, 2000
John T. Bahns, Storrs, CT (US);
William C. Stwalley, Mansfield Center, CT (US);
University of Connecticut, Farmington, CT (US);
Abstract
A noncontact method and apparatus for testing electrical circuitry which provides large improvements in both resolution and speed. The attributes of noncontact, high resolution, and speed are satisfied by using inexpensive low intensity resonant laser beams in a shroud gas preferably comprising rubidium atoms in argon gas to create an electrically conductive ion channel microprobe. The conductive ion channel microprobe can be used to create an electrically conductive path between a circuit's test pad or point and signal generation and detection apparatus. If the circuit's test pad or point is functioning properly, then the ion channel microprobe will complete the electrically conductive path, the signal generation device will produce a signal over the conductive path and the signal detection device will detect or measure the signal. If the circuit's test pad or point is malfunctioning, the conductive path will remain open and the signal detection device will not detect a signal.