The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2002
Filed:
Feb. 18, 2000
Günter Igel, Teningen, DE;
Hans-Jürgen Gahle, Emmendingen, DE;
Mirko Lehmann, Freiburg, DE;
Micronas GmbH, Feiburg, DE;
Abstract
A measuring device ( ), for examining a medium ( ) that is liquid or free-flowing, has at least two electrically and/or optically conducting layers or layer areas ( ) located on a substrate layer ( ), wherein these layers or layer areas are electrically and/or optically insulated from each other. At least one of these layers or layer areas ( ) is part of a layer stack ( ), which has several layers arranged on top of each other on the substrate layer ( ). The layer stack has, on its side facing away from the substrate layer ( ), a recess that adjoins the electrically and/or optically conducting layers or layer areas ( ). At least one electrically and/or optically conducting layer or layer area ( ) located in the layer stack ( ) is spaced at a distance from the bottom ( ) of the recess ( ).