The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2002
Filed:
Aug. 08, 2000
Applicant:
Inventors:
Waldermar Zylka, Hamburg, DE;
Jorg Sabczynski, Norderstedt, DE;
Jürgen Weese, Henstedt-Ulzburg, DE;
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/800 ;
U.S. Cl.
CPC ...
G01D 1/800 ;
Abstract
In an X-ray examination device and a method for generating distortion-free X-ray images the imaging properties are calculated and distortions are corrected by providing at least one calibration member ( ) for forming a reference pattern; a correction unit ( ) corrects the distortions in X-ray images on the basis of the pattern of the calibration members ( ) actually formed in the patient X-ray image (FIG. ) and the calculated reference pattern.