The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2002
Filed:
Aug. 05, 1999
Applicant:
Inventors:
Terry X. Beachey, Longmont, CO (US);
Russell N. Evans, Louisville, CO (US);
Assignee:
Dieterich Standard, Inc., Boulder, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 7/00 ;
U.S. Cl.
CPC ...
G01L 7/00 ;
Abstract
A differential pressure measuring probe with an improved signal to noise ratio is provided. The probe includes a substantially flat longitudinally extending impact surface that is configured to create a dome of high pressure in the impacting fluid. The dome of high pressure provides an increased stagnation area on the impact surface to reduce noise in the measurement of impact pressure. A non-impact surface is provided with non-impact apertures to measure a non-impact pressure such that differential pressure between the impact surface and the non-impact surface can be calculated.