The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Mar. 16, 2001
Applicant:
Inventors:
Thomas R. Bednar, Essex Junction, VT (US);
Paul S. Zuchowski, Jericho, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 9/45 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 9/45 ;
Abstract
A structure and method for improving yield during physical chip design comprises identifying non-critically timed minimum groundrule cells located within the chip design, determining if whitespace exists around the non-critically timed minimum groundrule cells, and replacing the non-critically timed minimum groundrule cells that have the whitespace with non-minimum groundrule cells if the replacing leaves a functionality of the circuit unaltered.
Bednar, Thomas. (2002). Substitution of non-minimum groundrule cells for non-critical minimum groundrule cells to increase yield (U.S. Patent No. 6470476). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6470476
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile