The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Jun. 30, 1999
Jacklyn Dowdy, Fort Collins, CO (US);
Kevin John Youngers, Greeley, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A document to be scanned is corner referenced on a transparent platen, with the document's image facing down. The platen defines an X-Y coordinate system. A moving line of light extends in the X direction and illuminates the document's image, line by line, as the line of light moves in the Y direction. The line of light that is thus reflected from the document is sensed by a linear CCD sensor array having a large number of individual sensor cells arranged in a line that extends in the X direction and coincides with the line of light. Multiple reference marks embodied in one or more reflection targets are located at a known position relative to the platen and/or its document referencing corner, to be scanned prior to scanning the document. Sensing of the reference marks enables (1) the X direction physical position of the CCD sensor array relative to the referencing corner to be accurately determined, (2) the Y direction physical position of the line of light relative to the referencing corner to be accurately determined, and (3) the platen's orientation with respect to the CCD array and line of light. A determination of the platen's orientation can include a determination of the platen's skew with respect to the CCD array and line of light, as well as a determination of the platen's orthogonality with respect to the direction of travel of a carriage which supports the CCD array and line of light.