The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Jun. 28, 2001
Applicant:
Inventors:
Martin S. Piltch, Los Alamos, NM (US);
R. Alan Patterson, Los Alamos, NM (US);
Gerald W. Leeches, Los Alamos, NM (US);
John Van Nierop, Largo, FL (US);
John J. Teti, Jr., Tampa, FL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract
Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is introduced into a device under test and to a time delay. Light reflected from the interior surfaces of the device under test is introduced into one end of a dye-cell and the time-delayed light is introduced into the other end. The amount of time delay is adjusted to produce two-photon fluorescence in the dye-cell so that the amount of time delay is representative of the interior surfaces of the device under test.