The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Jul. 26, 2001
Haruo Shimaoka, Nara, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Scattered light obtained by irradiating parallel laser beam to particles to be measured is condensed by a condenser lens in a wide angle area from 0° to over 40°, and an intensity distribution of the light is spatially continuously measured by an optical sensor positioned at a focal point of the condenser lens. Before a particle size distribution is calculated from the measured light intensity distribution, measuring error of the scattered light intensity distribution caused by an aberration by the condenser lens and an attenuation on the optical path is corrected by comparing with data obtained through a ray tracing in advance. Thus, the scattered light in a wider angle area are spatially continuously measured to thereby obtain a light intensity distribution with a high resolution in a submicron area.