The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Jun. 08, 1998
Applicant:
Inventors:
Assignee:
Minolta Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/47 ; B41J 2/9393 ;
U.S. Cl.
CPC ...
B41J 2/47 ; B41J 2/9393 ;
Abstract
Disclosed is a method for measuring light quantities emitted from an array of light shutter elements aligned in a main scan direction. The method measures the light quantities by scanning and sensing a recording paper on which an image is formed by the light shutter elements. The scan direction is orthogonal to a direction in the image corresponding to the main scan direction of the array.
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Wada, Kenichi. (2002). Optical quantity measuring method and optical quantity measuring apparatus using same (U.S. Patent No. 6469727). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6469727
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