The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
May. 10, 1999
Ming-Kai Tse, Lexington, MA (US);
Quality Engineering Associates, Inc., Burlington, MA (US);
Abstract
An automated test system is provided for evaluating characteristics of photoreceptors used in the electrophotographic process. The test system includes a dielectric material support adapted to receive said dielectric material one or more electrodes adapted to apply electrical energy from a source to a two dimensional area adjacent the support for storage by the dielectric material and a sensor for the electrical energy stored in the dielectric material and providing an output representation of the dielectric relaxation of the material in response to the stored energy over the two dimensional area. This test system provides advantages over conventional Electrostatic Charge Decay (ECD) methods by eliminating corona pre-charging and a moving detector when a full-length array is used. Also, this test system utilizes a lower cost current detector in comparison to conventionally used voltage detectors.