The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2002

Filed:

Aug. 31, 2001
Applicant:
Inventors:

Jian-Feng Chen, Issaquah, WA (US);

Dong-Chyuan Liu, Mercer Island, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 ;
U.S. Cl.
CPC ...
A61B 8/00 ;
Abstract

A 3-D region of interest (ROI) of a body is imaged, preferably using an ultrasound transducer. The intensity of an echo signal from each of a pattern of pixels within the ROI is measured and stored. The pixels are then grouped into pixel blocks, and the intensity values for the pixels in each sequentially selected current block are compiled in a current histogram. Each current histogram is compared with a reference histogram that corresponds to the distribution of echo signal intensities in a known region of speckle. A structure likelihood value is then computed based on the comparison, where the structure likelihood value indicates how likely it is that the current block corresponds to a structure of interest as opposed to noise. The intensity value for any pixel likely to be noise is preferably scaled down. The scaled intensity values are then projected, preferably using a maximum intensity projection, onto a 2-D display plane, a representation of which is then displayed for a user to see. The invention is able to image structures throughout the 3-D ROI even when they would otherwise be obscured by the speckle.


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