The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2002
Filed:
Aug. 09, 1999
Annette L. Latwesen, Marshalltown, IA (US);
Kenneth W. Junk, Marshalltown, IA (US);
Fisher Controls International, Inc., Clayton, MO (US);
Abstract
A method and apparatus statistically determines estimates of one or more process control loop parameters, such as bearing friction, seal friction, total friction, dead band, dead time, oscillation, shaft windup or backlash associated with a device or a control loop within a process control environment. The method and apparatus measures one or more signals within a process control loop when the process control loop is connected on-line within a process control environment, stores the measured signal as signal data and then performs one of a number of statistical analyses on the stored signal data to determine the desired parameter estimate.