The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2002

Filed:

Mar. 05, 2002
Applicant:
Inventors:

Eiro Fujii, Takatsuki, JP;

Koichi Shiono, Osaka, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/500 ;
U.S. Cl.
CPC ...
G01B 1/500 ;
Abstract

Based on the maximum value of distances between vertexes of polygons in a plurality of polygon meshes, the size of voxel is determined. Next, respective potential values for a plurality of polygon meshes are obtained on the basis of signed respective distances of voxels and a sum of the potential values is obtained as an added potential value. A polygon mesh made of an equivalent: face of the added potential value is defined as a surface mesh. Comparison between the surface mesh and the a plurality of original polygon meshes is performed, to determine respective vertexes (corresponding-vertexes) of a plurality of original meshes corresponding to each vertex of the surface mesh. The polygons of the surface mesh is divided/synthesized to obtain intermediate surface data. Referring to the original polygon meshes, respective vertexes of the intermediate surface data are moved. Composed polygon mesh data can be obtained with stability even if the original three-dimensional data have some errors, within a time of practical level, without unnecessarily high redundancy, while maintaining the accuracy and resolution of the three-dimensional multi-viewpoints data.


Find Patent Forward Citations

Loading…