The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2002

Filed:

Dec. 09, 1999
Applicant:
Inventors:

Robert B. Walance, Newbury Park, CA (US);

Wayne K. Wong, Camarillo, CA (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 1/24 ; H04M 3/08 ; H04M 3/22 ;
U.S. Cl.
CPC ...
H04M 1/24 ; H04M 3/08 ; H04M 3/22 ;
Abstract

A test system automatically locates impedance mismatched, energy reflection discontinuities (e.g., bridged taps) along a wireline communication link, by coupling a linearly stepped sinusoidal waveform to a measurement location of the wireline link. The applied waveform propagates down the link and is reflected back from the energy reflection discontinuities. A line monitoring receiver coupled to the measurement location samples the response of the line to the swept waveform. A response processor executes a frequency domain reflectometry algorithm to analyze the frequency response of the wireline to the stepped frequency waveform. It then generates an output representative of distances from the measurement location to the bridged taps.


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