The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2002
Filed:
Nov. 22, 2000
Jiang Hsieh, Brookfield, WI (US);
Jonathan R. Schmidt, Wales, WI (US);
Clarence L. Gordon, III, Delafield, WI (US);
Joseph L. Block, South Milwaukee, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
In one aspect, the present invention relates to tube-spit detection and correction. In an exemplary embodiment, and once a sample of projection data has been collected, the projection data is preprocessed in accordance with known preprocessing algorithms including applying a detector primary speed correction to the projection data. Such primary speed correction removes contamination of previous signal sample from the current sample. After primary speed correction, tube-spit detection is performed on the sample. Such detection can be performed using many different methods. Generally, the objective is to determine whether the x-ray source experienced a drop in power. If a tube-spit event is not detected, then processing proceeds with further preprocessing and image reconstruction. If a tube-spit event is detected, then a tube spit correction is performed. Generally, the objective of tube-spit correction is to remove image artifacts due to the occurrence of a tube-spit event. Many different methods can be utilized to perform tube-spit correction.