The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2002

Filed:

Jul. 26, 2000
Applicant:
Inventor:

Richard M Gooch, Surbiton, GB;

Assignee:

BAE Systems plc, Farnborough, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/114 ; G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/114 ; G01B 1/124 ;
Abstract

A method for calibrating position ( ) of each light source in a first set of light sources ( ) on a first part ( ) when the first set ( ) are attached thereto, including the steps of measuring first positions ( ) of each of the light sources in the first set ( ), each of said light sources ( ) being either an active light source or an illuminable reflecting point, generating a first set of light sources to facet mapping ( ), which first set to facet mapping ( ) specifies which facet ( ) of the first part ( ) each of the light sources in the first set ( ) are located on, estimating a transformation ( ) that transforms the first positions ( ) into a co-ordinate frame of the first part ( ), thereby generating estimated positions ( ) of each of the light sources in the first set ( ) on the first part ( ), which estimated positions ( ) are in the co-ordinate frame of the first part ( ), calculating ( ) first distances ( ) from the estimated positions ( ) to respective facets ( ) of the first part ( ), inputting the first distances ( ) into a least mean squares (LMS) error function (10 ) so as to generate a plurality of errors, and optimising said errors so as to locate the positions ( ) of said first set of light sources on the first part.


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