The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2002
Filed:
Jun. 16, 2000
Satoru Satake, Tokyo, JP;
Yukio Hosaka, Hiroshima, JP;
Hideharu Maruyama, Hiroshima, JP;
Nobuhiko Nakamura, Hiroshima, JP;
Satake Corporation, Tokyo, JP;
Abstract
From the crop of a predetermined area in a plant field under exposure to natural light, a reflectivity of the light having relation to crop information such as nitrogen content rate is measured by a camera; the crop information as first crop information is obtained from the first crop related formula established in advance for obtaining the crop information from the reflectivity; light is irradiated on crop leaf blades in the same area as the predetermined area and an amount of the light is measured; the crop information as second crop information is obtained from the second crop related formula established in advance for obtaining the crop information from the amount of the light; differences are calculated from the first crop information and the second crop information; the first crop information is obtained from the unknown crop in the predetermined area within the crop field of the same area; the first crop information is corrected based on the differences; and the nutritious diagnosis of the crop in the field is conducted by the corrected first crop information. In conducting diagnosis of crop by measuring the reflection light amount from the crop, since compensation or correction is performed, no great errors occur caused by differences in the measurement locations and the planting densities, and the diagnosis of the crop is simple and easy and, more over, the precision in the measuring is enhanced.