The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2002
Filed:
Aug. 14, 2000
Christian Bernatek, Rodgau, DE;
Bernd Rudolph, Alzanau, DE;
Atlas Material Testing Technology GmbH, Linsengericht/Altenhasslau, DE;
Abstract
A method for determining the time curve of the intensity of radiation present at the location of at least one sample which is being examined. The sample follows a circular path of movement in a sealed sample chamber of a weathering testing device, around a stationary radiation device for producing UW and global radiation. At least one sensor which detects the momentary radiation intensity of the radiation device is provided. The sensor moves together with the at least one sample, and is displaced in relation thereto in relation to the radiation device, for example in the peripheral direction of the path of movement. An electrical signal corresponding to the momentary intensity of the radiation is derived by the sensor at set intervals.