The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2002
Filed:
Aug. 20, 1998
Applicant:
Inventors:
Sang Van Nguyen, Huntington Beach, CA (US);
Foad Towfig, Oceanside, CA (US);
John Andrew White, Orange, CA (US);
Assignee:
McDonnell Douglas Corporation, St. Louis, MO (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract
A method and apparatus are provided for inspecting an end face of an optical fiber. The apparatus includes a memory device for storing images of acceptable end faces and unacceptable end faces, and an imaging system for obtaining an image of the end face of the optical fiber. Further, the apparatus includes a means, responsive to said imaging system, for comparing the image of the end fare of the optical fiber with the images of acceptable end faces and unacceptable end faces to automatically determine if the optical fiber is acceptable.