The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2002

Filed:

Nov. 01, 1999
Applicant:
Inventors:

Eric Gordon Baugh, San Jose, CA (US);

Myron Dale Flickner, San Jose, CA (US);

Robert Edward Fontana, Jr., San Jose, CA (US);

Stephen Arnold Olson, Palo Alto, CA (US);

Gurinder Pal Singh, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 ; H04N 7/18 ;
U.S. Cl.
CPC ...
H04N 9/47 ; H04N 7/18 ;
Abstract

A method and tool for measurement of the roll static attitude and y-misalignment of magnetic recording sliders within the head stack assembly having reference elements placed on the deposited end of the magnetic recording slider, which are optically analyzed by a video camera connected to a computer. For fast measurement the head stack assembly is clamped in a fixture mounted on motorized stages, which move each slider into the measurement position. In a two step imaging and analyzing process, the orientation and location of one or more edges of the reference element are computed and compared with known control parameters.


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