The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2002
Filed:
Oct. 17, 2001
Tobias Schaeffter, Hamburg, DE;
Peter Koken, Hamburg, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to an MR imaging method, notably for real-time imaging, in which the phase errors that occur in the MR signals because of inter alia eddy currents, are continuously monitored on the basis of the MR data sets acquired for imaging. To this end, MR signals that are successively acquired with different read-out gradients are related to one another in order to detect changes in the eddy current behavior on the basis of the phase differences. If necessary, calibration measurements are initiated so as to determine phase correction profiles whereby the phase errors of the MR data sets are compensated. For the imaging in accordance with the invention use can be made of Echo Planar Imaging (EPI) sequences for which individual, successively acquired echo signals are related to one another in order to monitor the phase errors. These echo signals are measured with the same phase encoding and with each time opposed read-out gradients for this purpose.
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